Large-angle rocking-beam electron diffraction (LARBED)
نویسندگان
چکیده
منابع مشابه
Inversion of Dynamical Scattering from Large-Angle Rocking-Beam Electron Diffraction Patterns.
A method for ab initio structure factor retrieval from large-angle rocking-beam electron diffraction data of thin crystals is described and tested with experimental and simulated data. No additional information, such as atomicity or information about chemical composition, has been made use of. Our numerical experiments show that the inversion of dynamical scattering works best, if the beam tilt...
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In convergent-beam electron diffraction (CBED) a highly convergent electron beam is focussed on to a small (~< 50 nm) area of the sample. Instead of the diffraction spots that are obtained in the back focal plane of the objective lens with parallel illumination in conventional selected-area electron diffraction, CBED produces discs of intensity. The point group can be determined uniquely from t...
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The development of new materials requires an understanding of their mode of growth and the nature of defects, interfaces and strains thereby incorporated. This paper shows how convergent beam electron diffraction (CBED) and large angle CBED (LACBED) can be used to analyse such problems. It is shown how CBED and LACBED can give two-beam rocking curves, which can be used to profile plane rotation...
متن کاملAn analysis of elementary dislocations in icosahedral Al-Pd-Mn by Large Angle Convergent-Beam Electron Diffraction (LACBED)
Large Angle Convergent Beam Electron Diffraction (LACBED) experiments on dislocations located in the mirror planes of icosahedral AlPdMn single grains show that – as previously inferred from standard image contrast technique – the direction of the Burgers vector is perpendicular to the mirror plane of movement, thus confirming the fact that climb should be an important process for the plasticit...
متن کاملSelected-Area Small-Angle Electron Diffraction
Selected-area electron diffraction capable of resolving spacings up to 2000 ]k from first-order discrete reflections has been achieved using a standard, double-condenser electron microscope. The technique allows photographing of the selected area, at sufficient magnification, that gives rise to the small-angle scattering pattern, in addition to the normal capabilities of obtaining related wide-...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2011
ISSN: 0108-7673
DOI: 10.1107/s0108767311082365